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KMID : 1146720160030010016
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국제컴퓨터가상수술학회 학술지
2016 Volume.3 No. 1 p.16 ~ p.21
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3D Inspection by Registration of CT and Dual X-ray Images
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Kim Young-Jun
Kim Won-Tae
Lee Deuk-Hee
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Abstract
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Computed tomography (CT) can completely digitize the interior and the exterior of nearly any object without any destruction. Generally, the resolution for industrial CT is below a few microns. The industrial CT scanning, however, has a limitation because it requires long measuring and processing time. Whereas, 2D X-ray imaging is fast. In this paper, we propose a novel concept of 3D non-destructive inspection technique using the advantages of both micro-CT and dual X-ray images. After registering the master object’s CT data and the sample objects’ dual X-ray images, 3D non-destructive inspection is possible by analyzing the matching results. Calculation for the registration is accelerated by parallel computing using graphics processing unit (GPU).
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KEYWORD
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Non-destructive inspection, Image registration, Micro-CT, Dual X-ray, Stereo X-ray
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